APA (7th ed.) Citation

Barocco, R., Lee, W. S. D., & Hortman, G. Yield Mapping Hardware Components for Grains and Cotton Using On-the-Go Monitoring Systems. The University of Florida George A. Smathers Libraries.

Chicago Style (17th ed.) Citation

Barocco, Rebecca, Won Suk Daniel Lee, and Garret Hortman. Yield Mapping Hardware Components for Grains and Cotton Using On-the-Go Monitoring Systems. The University of Florida George A. Smathers Libraries.

MLA (9th ed.) Citation

Barocco, Rebecca, et al. Yield Mapping Hardware Components for Grains and Cotton Using On-the-Go Monitoring Systems. The University of Florida George A. Smathers Libraries.