Bui, Q. C., Lin, W., Huang, Q., & Byun, G. Automated Internal Defect Identification and Localization Based on a Near-Field SAR Millimeter-Wave Imaging System. IEEE.
Chicago Style (17th ed.) CitationBui, Quoc Cuong, Weizhi Lin, Qiang Huang, and Gyung-Su Byun. Automated Internal Defect Identification and Localization Based on a Near-Field SAR Millimeter-Wave Imaging System. IEEE.
MLA (9th ed.) CitationBui, Quoc Cuong, et al. Automated Internal Defect Identification and Localization Based on a Near-Field SAR Millimeter-Wave Imaging System. IEEE.
Warning: These citations may not always be 100% accurate.