APA (7th ed.) Citation

Yang, X., Shi, M., Hong, M., Hui, Z., Pan, J., Xiu, G., & Zhou, L. In situ quantification of fungicide residue on wheat leaf surfaces using matrix-assisted laser desorption/ionization time-of-flight mass spectrometry imaging technology. Elsevier.

Chicago Style (17th ed.) Citation

Yang, Xuerui, Mengyao Shi, Minghui Hong, Zhixin Hui, Jiaqi Pan, Guangli Xiu, and Lei Zhou. In Situ Quantification of Fungicide Residue on Wheat Leaf Surfaces Using Matrix-assisted Laser Desorption/ionization Time-of-flight Mass Spectrometry Imaging Technology. Elsevier.

MLA (9th ed.) Citation

Yang, Xuerui, et al. In Situ Quantification of Fungicide Residue on Wheat Leaf Surfaces Using Matrix-assisted Laser Desorption/ionization Time-of-flight Mass Spectrometry Imaging Technology. Elsevier.