In situ quantification of fungicide residue on wheat leaf surfaces using matrix-assisted laser desorption/ionization time-of-flight mass spectrometry imaging technology

In situ quantification of fungicide residue on wheat leaf surfaces using matrix-assisted laser desorption/ionization time-of-flight mass spectrometry imaging technology

To overcome the time-consuming off-site limitations in conventional pesticide detection, this contribution presents an in situ quantitative analysis detection strategy for pesticides on leaf surfaces using matrix-assisted laser desorption/ionization time-of-flight mass spectrometry imaging technolog...

Full description

Saved in:
Bibliographic Details
Main Authors: Xuerui Yang, Mengyao Shi, Minghui Hong, Zhixin Hui, Jiaqi Pan, Guangli Xiu, Lei Zhou
Format: Article
Language:English
Published: Elsevier 2025-01-01
Series:Food Chemistry: X
Subjects:
Leaf
Matrices
Metrafenone
Pesticide
Sublimation spraying
Online Access:http://www.sciencedirect.com/science/article/pii/S2590157525000082
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items

Similar Items