Petals morphology formation and pseudocapacitive properties of LiGa5O8 ceramics

The LiGa5O8 samples have been prepared using the solid-state reaction method (annealed at 800 ⁰C and 1300 ⁰C) and investigated for electrochemical properties. X-ray diffraction (XRD) results confirmed the spinel structure stability up to 1300 ⁰C. Scanning electron microscopy (SEM) results convey pet...

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Bibliographic Details
Main Authors: Aditya Sharma, Manas Nasit, Nitin Kumar Gautam, Shalendra Kumar, Ranjeet Brajpuriya, B.H. Lee, S.O. Won, Mayora Varshney, Nishima Chaddha, H.J. Shin
Format: Article
Language:English
Published: Elsevier 2025-04-01
Series:Next Materials
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Online Access:http://www.sciencedirect.com/science/article/pii/S2949822825000395
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Summary:The LiGa5O8 samples have been prepared using the solid-state reaction method (annealed at 800 ⁰C and 1300 ⁰C) and investigated for electrochemical properties. X-ray diffraction (XRD) results confirmed the spinel structure stability up to 1300 ⁰C. Scanning electron microscopy (SEM) results convey petals-like morphology formation in the LiGa5O8 compounds. The 800 ⁰C annealed sample consists of two different pores of 41.5 Å and 72.3 Å with a larger specific surface area of 0.982 m2/g. The 1300 ⁰C annealed sample obeys a specific surface area of 0.433 m2/g and a single pore of the size of 48.5 Å. The redox feature-rich CV curves and the pseudo-capacitance charging/discharging characteristics from GCD results have offered a specific capacitance of ∼107.6 F/g (at a scan rate of 5 mV/s) and 141.8 F/g (at a current density of 1 A/g), respectively, for LiGa5O8-800 sample. The LiGa5O8 −1300 sample could exhibit lesser specific capacitance of 84.4 F/g (at 5 mV/s scan rate) and 97.2 F/g (at a current density of 1 A/g) due to the inferior adsorption/desorption and lithiation/delithiation reactions at the petals of subordinate surface area and pores. LiGa5O8-800 and LiGa5O8-1300 samples have exhibited 77 % and 70 % retention up to 3000 cycles. Our results pave the way to explore new, cost-effective, and stable oxide systems for energy storage devices.
ISSN:2949-8228