Vijai, P., & P, B. S. Anomaly detection solutions: The dynamic loss approach in VAE for manufacturing and IoT environment. Elsevier.
Chicago Style (17th ed.) CitationVijai, Praveen, and Bagavathi Sivakumar P. Anomaly Detection Solutions: The Dynamic Loss Approach in VAE for Manufacturing and IoT Environment. Elsevier.
MLA (9th ed.) CitationVijai, Praveen, and Bagavathi Sivakumar P. Anomaly Detection Solutions: The Dynamic Loss Approach in VAE for Manufacturing and IoT Environment. Elsevier.
Warning: These citations may not always be 100% accurate.