Analysis and applications of a heralded electron source
We analytically describe the noise properties of a heralded electron source made from a standard electron gun, a weak photonic coupler, a single photon counter, and an electron energy filter. We describe the sub-Poissonian statistics of the source, the engineering requirements for efficient heraldin...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
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IOP Publishing
2025-01-01
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| Series: | New Journal of Physics |
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| Online Access: | https://doi.org/10.1088/1367-2630/ada8d0 |
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| _version_ | 1825206153928245248 |
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| author | Stewart A Koppell John W Simonaitis Maurice A R Krielaart William P Putnam Karl K Berggren Phillip D Keathley |
| author_facet | Stewart A Koppell John W Simonaitis Maurice A R Krielaart William P Putnam Karl K Berggren Phillip D Keathley |
| author_sort | Stewart A Koppell |
| collection | DOAJ |
| description | We analytically describe the noise properties of a heralded electron source made from a standard electron gun, a weak photonic coupler, a single photon counter, and an electron energy filter. We describe the sub-Poissonian statistics of the source, the engineering requirements for efficient heralding, and several potential applications. We use simple models of electron beam processes to demonstrate advantages which are situational, but potentially significant in electron lithography and scanning electron microscopy. |
| format | Article |
| id | doaj-art-5a456b7dce2e49f8a6f06fc46992a50d |
| institution | Kabale University |
| issn | 1367-2630 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | IOP Publishing |
| record_format | Article |
| series | New Journal of Physics |
| spelling | doaj-art-5a456b7dce2e49f8a6f06fc46992a50d2025-02-07T12:44:05ZengIOP PublishingNew Journal of Physics1367-26302025-01-0127202301210.1088/1367-2630/ada8d0Analysis and applications of a heralded electron sourceStewart A Koppell0https://orcid.org/0000-0002-7022-0311John W Simonaitis1Maurice A R Krielaart2William P Putnam3Karl K Berggren4https://orcid.org/0000-0001-7453-9031Phillip D Keathley5https://orcid.org/0000-0003-1325-1768Research Laboratory of Electronics, Massachusetts Institute of Technology , Cambridge, MA 02139, United States of AmericaResearch Laboratory of Electronics, Massachusetts Institute of Technology , Cambridge, MA 02139, United States of AmericaResearch Laboratory of Electronics, Massachusetts Institute of Technology , Cambridge, MA 02139, United States of AmericaDepartment of Electrical and Computer Engineering, University of California , Davis, Davis, CA 95616, United States of AmericaResearch Laboratory of Electronics, Massachusetts Institute of Technology , Cambridge, MA 02139, United States of AmericaResearch Laboratory of Electronics, Massachusetts Institute of Technology , Cambridge, MA 02139, United States of AmericaWe analytically describe the noise properties of a heralded electron source made from a standard electron gun, a weak photonic coupler, a single photon counter, and an electron energy filter. We describe the sub-Poissonian statistics of the source, the engineering requirements for efficient heralding, and several potential applications. We use simple models of electron beam processes to demonstrate advantages which are situational, but potentially significant in electron lithography and scanning electron microscopy.https://doi.org/10.1088/1367-2630/ada8d0electron microscopyelectron sourcesscanning electron microscopyscanning transmission electron microscopyelectron lithography |
| spellingShingle | Stewart A Koppell John W Simonaitis Maurice A R Krielaart William P Putnam Karl K Berggren Phillip D Keathley Analysis and applications of a heralded electron source New Journal of Physics electron microscopy electron sources scanning electron microscopy scanning transmission electron microscopy electron lithography |
| title | Analysis and applications of a heralded electron source |
| title_full | Analysis and applications of a heralded electron source |
| title_fullStr | Analysis and applications of a heralded electron source |
| title_full_unstemmed | Analysis and applications of a heralded electron source |
| title_short | Analysis and applications of a heralded electron source |
| title_sort | analysis and applications of a heralded electron source |
| topic | electron microscopy electron sources scanning electron microscopy scanning transmission electron microscopy electron lithography |
| url | https://doi.org/10.1088/1367-2630/ada8d0 |
| work_keys_str_mv | AT stewartakoppell analysisandapplicationsofaheraldedelectronsource AT johnwsimonaitis analysisandapplicationsofaheraldedelectronsource AT mauricearkrielaart analysisandapplicationsofaheraldedelectronsource AT williampputnam analysisandapplicationsofaheraldedelectronsource AT karlkberggren analysisandapplicationsofaheraldedelectronsource AT phillipdkeathley analysisandapplicationsofaheraldedelectronsource |