Lu, H., Yao, D., Yip, J., Kan, C., & Guo, H. Addressing COVID-19 Spread: Development of Reliable Testing System for Mask Reuse. Springer.
Chicago Style (17th ed.) CitationLu, Haoxian, Dawen Yao, Joanne Yip, Chi-Wai Kan, and Hai Guo. Addressing COVID-19 Spread: Development of Reliable Testing System for Mask Reuse. Springer.
MLA (9th ed.) CitationLu, Haoxian, et al. Addressing COVID-19 Spread: Development of Reliable Testing System for Mask Reuse. Springer.
Warning: These citations may not always be 100% accurate.