APA (7th ed.) Citation

Galluzzi, M., Lancia, M., Zheng, C., Re, V., Castelvetro, V., Guo, S., & Viaroli, S. Atomic Force Microscopy (AFM) nanomechanical characterization of micro- and nanoplastics to support environmental investigations in groundwater. KeAi Communications Co., Ltd.

Chicago Style (17th ed.) Citation

Galluzzi, Massimiliano, Michele Lancia, Chunmiao Zheng, Viviana Re, Valter Castelvetro, Shifeng Guo, and Stefano Viaroli. Atomic Force Microscopy (AFM) Nanomechanical Characterization of Micro- and Nanoplastics to Support Environmental Investigations in Groundwater. KeAi Communications Co., Ltd.

MLA (9th ed.) Citation

Galluzzi, Massimiliano, et al. Atomic Force Microscopy (AFM) Nanomechanical Characterization of Micro- and Nanoplastics to Support Environmental Investigations in Groundwater. KeAi Communications Co., Ltd.