Yield Mapping Hardware Components for Grains and Cotton Using On-the-Go Monitoring Systems
This 12-page fact sheet discusses yield mapping benefits, grain yield flow sensors, grain moisture sensors, cotton yield flow sensors, differential GNSS receivers, ground speed sensors, header position sensors, computer displays, yield calculation and calibration, and costs of yield mapping hardwar...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
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The University of Florida George A. Smathers Libraries
2017-06-01
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| Series: | EDIS |
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| Online Access: | https://journals.flvc.org/edis/article/view/93374 |
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| _version_ | 1823868754994397184 |
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| author | Rebecca Barocco Won Suk Daniel Lee Garret Hortman |
| author_facet | Rebecca Barocco Won Suk Daniel Lee Garret Hortman |
| author_sort | Rebecca Barocco |
| collection | DOAJ |
| description |
This 12-page fact sheet discusses yield mapping benefits, grain yield flow sensors, grain moisture sensors, cotton yield flow sensors, differential GNSS receivers, ground speed sensors, header position sensors, computer displays, yield calculation and calibration, and costs of yield mapping hardware components.
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| format | Article |
| id | doaj-art-aaff4ab507884ee08adfc9e2e9c68b4e |
| institution | Kabale University |
| issn | 2576-0009 |
| language | English |
| publishDate | 2017-06-01 |
| publisher | The University of Florida George A. Smathers Libraries |
| record_format | Article |
| series | EDIS |
| spelling | doaj-art-aaff4ab507884ee08adfc9e2e9c68b4e2025-02-08T05:55:46ZengThe University of Florida George A. Smathers LibrariesEDIS2576-00092017-06-0120173Yield Mapping Hardware Components for Grains and Cotton Using On-the-Go Monitoring SystemsRebecca Barocco0Won Suk Daniel Lee1Garret Hortman2University of FloridaUniversity of Floridaintegrated solutions manager, Ag-Pro, Thomasville, GA 31792. This 12-page fact sheet discusses yield mapping benefits, grain yield flow sensors, grain moisture sensors, cotton yield flow sensors, differential GNSS receivers, ground speed sensors, header position sensors, computer displays, yield calculation and calibration, and costs of yield mapping hardware components. https://journals.flvc.org/edis/article/view/93374AE518I1P2small grainsoatsryewheat |
| spellingShingle | Rebecca Barocco Won Suk Daniel Lee Garret Hortman Yield Mapping Hardware Components for Grains and Cotton Using On-the-Go Monitoring Systems EDIS AE518 I1P2 small grains oats rye wheat |
| title | Yield Mapping Hardware Components for Grains and Cotton Using On-the-Go Monitoring Systems |
| title_full | Yield Mapping Hardware Components for Grains and Cotton Using On-the-Go Monitoring Systems |
| title_fullStr | Yield Mapping Hardware Components for Grains and Cotton Using On-the-Go Monitoring Systems |
| title_full_unstemmed | Yield Mapping Hardware Components for Grains and Cotton Using On-the-Go Monitoring Systems |
| title_short | Yield Mapping Hardware Components for Grains and Cotton Using On-the-Go Monitoring Systems |
| title_sort | yield mapping hardware components for grains and cotton using on the go monitoring systems |
| topic | AE518 I1P2 small grains oats rye wheat |
| url | https://journals.flvc.org/edis/article/view/93374 |
| work_keys_str_mv | AT rebeccabarocco yieldmappinghardwarecomponentsforgrainsandcottonusingonthegomonitoringsystems AT wonsukdaniellee yieldmappinghardwarecomponentsforgrainsandcottonusingonthegomonitoringsystems AT garrethortman yieldmappinghardwarecomponentsforgrainsandcottonusingonthegomonitoringsystems |