Topological defects in Floquet circuits

We introduce a Floquet circuit describing the driven Ising chain with topological defects. The corresponding gates include a defect that flips spins as well as the duality defect that explicitly implements the Kramers-Wannier duality transformation. The Floquet unitary evolution operator commutes wi...

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Bibliographic Details
Main Author: Mao Tian Tan, Yifan Wang, Aditi Mitra
Format: Article
Language:English
Published: SciPost 2024-03-01
Series:SciPost Physics
Online Access:https://scipost.org/SciPostPhys.16.3.075
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