APA (7th ed.) Citation

Ercolano, F., Balestra, L., Krause, S., Leone, S., Streicher, I., Waltereit, P., . . . Reggiani, S. TCAD analysis of the high-temperature reverse-bias stress on AlGaN/GaN HEMTs. Elsevier.

Chicago Style (17th ed.) Citation

Ercolano, Franco, Luigi Balestra, Sebastian Krause, Stefano Leone, Isabel Streicher, Patrik Waltereit, Michael Dammann, and Susanna Reggiani. TCAD Analysis of the High-temperature Reverse-bias Stress on AlGaN/GaN HEMTs. Elsevier.

MLA (9th ed.) Citation

Ercolano, Franco, et al. TCAD Analysis of the High-temperature Reverse-bias Stress on AlGaN/GaN HEMTs. Elsevier.