SRAM and Mixed-Signal Logic With Noise Immunity in 3-nm Nano-Sheet Technology

A modular 4.26 Mb SRAM based on a 82 Kb/block structure with mixed signal logic is fabricated, characterized, and demonstrated with full functionality in a 3-nm nanosheet (NS) technology. Designed macros utilize new circuits for supply boosting, read, and write assist techniques. The proposed circui...

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Main Authors: Rajiv V. Joshi, J. Frougier, Alberto Cestero, Crystal Castellanos, Sudipto Chakraborty, Carl Radens, M. Silvestre, S. Lucarini, I. Ahsan, E. Leobandung
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Open Journal of the Solid-State Circuits Society
Subjects:
Online Access:https://ieeexplore.ieee.org/document/10839490/
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author Rajiv V. Joshi
J. Frougier
Alberto Cestero
Crystal Castellanos
Sudipto Chakraborty
Carl Radens
M. Silvestre
S. Lucarini
I. Ahsan
E. Leobandung
author_facet Rajiv V. Joshi
J. Frougier
Alberto Cestero
Crystal Castellanos
Sudipto Chakraborty
Carl Radens
M. Silvestre
S. Lucarini
I. Ahsan
E. Leobandung
author_sort Rajiv V. Joshi
collection DOAJ
description A modular 4.26 Mb SRAM based on a 82 Kb/block structure with mixed signal logic is fabricated, characterized, and demonstrated with full functionality in a 3-nm nanosheet (NS) technology. Designed macros utilize new circuits for supply boosting, read, and write assist techniques. The proposed circuits are evaluated extensively and compared to prior techniques. Statistical simulations are used to predict the benefits of these circuits in the context of dual supply use. Through programmable local clock and wordline (WL) pulsewidths, SRAM cell margins and speeds are demonstrated through hardware measurement. Stability assists as well as dual supply techniques are used to demonstrate how noise can be suppressed during traditional memory operations (single WL on), as well as to support mixed-signal logic block operation (multiple WLs on). Functionality is shown down to a cell supply of 0.45 V with an estimated margin/speed of 6 GHz for SRAM cells (high density&#x2014;<inline-formula> <tex-math notation="LaTeX">$0.026~\mu $ </tex-math></inline-formula>m<sup>2</sup>, and high current&#x2014;<inline-formula> <tex-math notation="LaTeX">$0.032~\mu $ </tex-math></inline-formula>m<sup>2</sup>).
format Article
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institution Kabale University
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publishDate 2025-01-01
publisher IEEE
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series IEEE Open Journal of the Solid-State Circuits Society
spelling doaj-art-ce52f5422b6b44e48a0d4fd5f372d9c12025-02-12T00:03:01ZengIEEEIEEE Open Journal of the Solid-State Circuits Society2644-13492025-01-015607410.1109/OJSSCS.2024.352449510839490SRAM and Mixed-Signal Logic With Noise Immunity in 3-nm Nano-Sheet TechnologyRajiv V. Joshi0https://orcid.org/0009-0007-7486-1531J. Frougier1Alberto Cestero2Crystal Castellanos3https://orcid.org/0009-0004-3947-1157Sudipto Chakraborty4https://orcid.org/0000-0001-9884-5850Carl Radens5https://orcid.org/0009-0008-8877-6888M. Silvestre6S. Lucarini7I. Ahsan8E. Leobandung9Hybrid Cloud, IBM T. J. Watson Research Center, Yorktown Heights, NY, USAHybrid Cloud, IBM Research Center, Albany, NY, USAHybrid Cloud, IBM Research Center, Albany, NY, USAIBM Infrastructure, IBM, Rochester, MN, USAHybrid Cloud, IBM T. J. Watson Research Center, Yorktown Heights, NY, USAHybrid Cloud, IBM Research Center, Albany, NY, USAHybrid Cloud, IBM Research Center, Albany, NY, USAHybrid Cloud, IBM Research Center, Albany, NY, USAHybrid Cloud, IBM Research Center, Albany, NY, USAHybrid Cloud, IBM T. J. Watson Research Center, Yorktown Heights, NY, USAA modular 4.26 Mb SRAM based on a 82 Kb/block structure with mixed signal logic is fabricated, characterized, and demonstrated with full functionality in a 3-nm nanosheet (NS) technology. Designed macros utilize new circuits for supply boosting, read, and write assist techniques. The proposed circuits are evaluated extensively and compared to prior techniques. Statistical simulations are used to predict the benefits of these circuits in the context of dual supply use. Through programmable local clock and wordline (WL) pulsewidths, SRAM cell margins and speeds are demonstrated through hardware measurement. Stability assists as well as dual supply techniques are used to demonstrate how noise can be suppressed during traditional memory operations (single WL on), as well as to support mixed-signal logic block operation (multiple WLs on). Functionality is shown down to a cell supply of 0.45 V with an estimated margin/speed of 6 GHz for SRAM cells (high density&#x2014;<inline-formula> <tex-math notation="LaTeX">$0.026~\mu $ </tex-math></inline-formula>m<sup>2</sup>, and high current&#x2014;<inline-formula> <tex-math notation="LaTeX">$0.032~\mu $ </tex-math></inline-formula>m<sup>2</sup>).https://ieeexplore.ieee.org/document/10839490/Compute-in-memory (CIM)Gate all around (GAA)low Vminnanosheet (NS)read assistSRAM
spellingShingle Rajiv V. Joshi
J. Frougier
Alberto Cestero
Crystal Castellanos
Sudipto Chakraborty
Carl Radens
M. Silvestre
S. Lucarini
I. Ahsan
E. Leobandung
SRAM and Mixed-Signal Logic With Noise Immunity in 3-nm Nano-Sheet Technology
IEEE Open Journal of the Solid-State Circuits Society
Compute-in-memory (CIM)
Gate all around (GAA)
low Vmin
nanosheet (NS)
read assist
SRAM
title SRAM and Mixed-Signal Logic With Noise Immunity in 3-nm Nano-Sheet Technology
title_full SRAM and Mixed-Signal Logic With Noise Immunity in 3-nm Nano-Sheet Technology
title_fullStr SRAM and Mixed-Signal Logic With Noise Immunity in 3-nm Nano-Sheet Technology
title_full_unstemmed SRAM and Mixed-Signal Logic With Noise Immunity in 3-nm Nano-Sheet Technology
title_short SRAM and Mixed-Signal Logic With Noise Immunity in 3-nm Nano-Sheet Technology
title_sort sram and mixed signal logic with noise immunity in 3 nm nano sheet technology
topic Compute-in-memory (CIM)
Gate all around (GAA)
low Vmin
nanosheet (NS)
read assist
SRAM
url https://ieeexplore.ieee.org/document/10839490/
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