APA (7th ed.) Citation

Fai, C., Ladd, A. J., Hages, C. J., Manoukian, G. A., & Baxter, J. B. Parallel tempered Bayesian inference for characterizing non-ideal semiconductors: Carrier trapping in cadmium telluride thin films. Elsevier.

Chicago Style (17th ed.) Citation

Fai, Calvin, Anthony J.C Ladd, Charles J. Hages, Gregory A. Manoukian, and Jason B. Baxter. Parallel Tempered Bayesian Inference for Characterizing Non-ideal Semiconductors: Carrier Trapping in Cadmium Telluride Thin Films. Elsevier.

MLA (9th ed.) Citation

Fai, Calvin, et al. Parallel Tempered Bayesian Inference for Characterizing Non-ideal Semiconductors: Carrier Trapping in Cadmium Telluride Thin Films. Elsevier.