Optical time-lapsed in situ mechanochemical studies on metal halide perovskite systems by Yonghao Xiao, David G. Bradley, Wei Xin Chan, Xinwen Hu, Lian Xiao, Zhenpeng Liu, Zi Yang Tan, Xin Zhao, Chenfei Li, Mansour Sadek, Vikash Kumar Ravi, Ying Hern Tam, Xiaotao Wang, Felipe García, Handong Sun, Seow Chin Low, Poh Boon Phua, Tze Chien Sum, Xiuwen Zhou, Yee-Fun Lim, John V. Hanna, Han Sen Soo

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Characterization and simulation of AlGaN barrier structure effects in normally-off recessed gate AlGaN/GaN MISHEMTs by An-Chen Liu, Hsin-Chu Chen, Po-Tsung Tu, Yan-Lin Chen, Yan-Chieh Chen, Po-Chun Yeh, Chih-I Wu, Shu-Tong Chang, Tsung-Sheng Kao, Hao-Chung Kuo

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Progress of research on aviation kerosene preparation using bioethanol by Pan LI, Yu ZHAO, Xingguo WU, Lulu ZHANG, Junhao HU, Wei CHEN, Jing BAI, Chun CHANG, Shuqi FANG

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Giant energy storage density with ultrahigh efficiency in multilayer ceramic capacitors via interlaminar strain engineering by Ying Yang, Ke Xu, Bin Yang, Xu Hou, Zhanming Dou, Yuhong Li, Zihao Zheng, Gengguang Luo, Nengneng Luo, Guanglong Ge, Jiwei Zhai, Yuanyuan Fan, Jing Wang, Haoming Yang, Yao Zhang, Jing Wang, Changyuan Wang, Shenglin Jiang, Kanghua Li, Jinming Guo, Houbing Huang, Guangzu Zhang

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Evaluasi Penggunaan SLiMS pada E-Library dengan Menggunakan User Experience Question (EUQ) by M. Azman Maricar, Dian Pramana, Dian Rahmani Putri

“…Tampilan diupayakan lebih sederhana sehingga produk mudah untuk dipahami dan dipelajari serta dapat lebih memudahkan pengguna dalam penggunaannya.   Abstract Product manufacture must be based on needs and evaluated to obtain appropriate data from the user experience. …”
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Julius Kruopis – the pioneer of applied statistics in Lithuania by Vilijandas Bagdonavičius, Vydas Čekanavičius, Rūta Levulienė, Pranas Vaitkus

“…These  applications are mainly related to optimization of  control systems, regulation and management of technological processes (acceptance control of materials and details, intermediate control of manufactured details and nodes, outgoing production control, metrological control of measuring devices, product reliability control, etc.). …”
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