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    Automated Internal Defect Identification and Localization Based on a Near-Field SAR Millimeter-Wave Imaging System

    Automated Internal Defect Identification and Localization Based on a Near-Field SAR Millimeter-Wave Imaging System by Quoc Cuong Bui, Weizhi Lin, Qiang Huang, Gyung-Su Byun

    Published 2025-01-01
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