Precision tests of third-generation four-quark operators: one- and two-loop matching

Abstract We calculate the one- and two-loop matching corrections in the Standard Model effective field theory (SMEFT) that impact electroweak precision measurements and flavour physics observables, focusing on the contributions of third-generation four-quark operators. Our results provide a crucial...

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Bibliographic Details
Main Authors: Ulrich Haisch, Luc Schnell
Format: Article
Language:English
Published: SpringerOpen 2025-02-01
Series:Journal of High Energy Physics
Subjects:
Online Access:https://doi.org/10.1007/JHEP02(2025)038
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