Precision tests of third-generation four-quark operators: one- and two-loop matching

Abstract We calculate the one- and two-loop matching corrections in the Standard Model effective field theory (SMEFT) that impact electroweak precision measurements and flavour physics observables, focusing on the contributions of third-generation four-quark operators. Our results provide a crucial...

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Main Authors: Ulrich Haisch, Luc Schnell
Format: Article
Language:English
Published: SpringerOpen 2025-02-01
Series:Journal of High Energy Physics
Subjects:
Online Access:https://doi.org/10.1007/JHEP02(2025)038
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author Ulrich Haisch
Luc Schnell
author_facet Ulrich Haisch
Luc Schnell
author_sort Ulrich Haisch
collection DOAJ
description Abstract We calculate the one- and two-loop matching corrections in the Standard Model effective field theory (SMEFT) that impact electroweak precision measurements and flavour physics observables, focusing on the contributions of third-generation four-quark operators. Our results provide a crucial ingredient for a model-independent analysis of constraints on beyond the Standard Model physics that primarily affects the sector of third-generation four-quark operators. Concise analytic expressions are provided for all considered precision observables, which should facilitate their inclusion into global SMEFT analyses.
format Article
id doaj-art-e3d173359f9f451a904c7f80550121c4
institution Kabale University
issn 1029-8479
language English
publishDate 2025-02-01
publisher SpringerOpen
record_format Article
series Journal of High Energy Physics
spelling doaj-art-e3d173359f9f451a904c7f80550121c42025-02-09T12:08:52ZengSpringerOpenJournal of High Energy Physics1029-84792025-02-012025214010.1007/JHEP02(2025)038Precision tests of third-generation four-quark operators: one- and two-loop matchingUlrich Haisch0Luc Schnell1Max Planck Institute for PhysicsMax Planck Institute for PhysicsAbstract We calculate the one- and two-loop matching corrections in the Standard Model effective field theory (SMEFT) that impact electroweak precision measurements and flavour physics observables, focusing on the contributions of third-generation four-quark operators. Our results provide a crucial ingredient for a model-independent analysis of constraints on beyond the Standard Model physics that primarily affects the sector of third-generation four-quark operators. Concise analytic expressions are provided for all considered precision observables, which should facilitate their inclusion into global SMEFT analyses.https://doi.org/10.1007/JHEP02(2025)038Electroweak Precision PhysicsHigher Order Electroweak CalculationsRare DecaysSMEFT
spellingShingle Ulrich Haisch
Luc Schnell
Precision tests of third-generation four-quark operators: one- and two-loop matching
Journal of High Energy Physics
Electroweak Precision Physics
Higher Order Electroweak Calculations
Rare Decays
SMEFT
title Precision tests of third-generation four-quark operators: one- and two-loop matching
title_full Precision tests of third-generation four-quark operators: one- and two-loop matching
title_fullStr Precision tests of third-generation four-quark operators: one- and two-loop matching
title_full_unstemmed Precision tests of third-generation four-quark operators: one- and two-loop matching
title_short Precision tests of third-generation four-quark operators: one- and two-loop matching
title_sort precision tests of third generation four quark operators one and two loop matching
topic Electroweak Precision Physics
Higher Order Electroweak Calculations
Rare Decays
SMEFT
url https://doi.org/10.1007/JHEP02(2025)038
work_keys_str_mv AT ulrichhaisch precisiontestsofthirdgenerationfourquarkoperatorsoneandtwoloopmatching
AT lucschnell precisiontestsofthirdgenerationfourquarkoperatorsoneandtwoloopmatching