Precision tests of third-generation four-quark operators: one- and two-loop matching
Abstract We calculate the one- and two-loop matching corrections in the Standard Model effective field theory (SMEFT) that impact electroweak precision measurements and flavour physics observables, focusing on the contributions of third-generation four-quark operators. Our results provide a crucial...
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Main Authors: | Ulrich Haisch, Luc Schnell |
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Format: | Article |
Language: | English |
Published: |
SpringerOpen
2025-02-01
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Series: | Journal of High Energy Physics |
Subjects: | |
Online Access: | https://doi.org/10.1007/JHEP02(2025)038 |
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